{"id":"SUSE-SU-2026:21283-1","summary":"Security update for opensc","details":"This update for opensc fixes the following issues:\n\n- CVE-2025-49010: stack-buffer-overflow via crafted smart card or USB device responses (bsc#1261214).\n- CVE-2025-66037: crafted input can cause an out-of-bounds read (bsc#1261218).\n- CVE-2025-66038: improper compact-TLV length validation can lead to crash or unexpected behavior (bsc#1261219).\n- CVE-2025-66215: crafted smart card or USB device can cause a stack-buffer-overflow write (bsc#1261220).\n","modified":"2026-04-28T18:28:29.374376Z","published":"2026-04-22T11:16:41Z","related":["CVE-2025-49010","CVE-2025-66037","CVE-2025-66038","CVE-2025-66215"],"upstream":["CVE-2025-49010","CVE-2025-66037","CVE-2025-66038","CVE-2025-66215"],"references":[{"type":"ADVISORY","url":"https://www.suse.com/support/update/announcement/2026/suse-su-202621283-1/"},{"type":"REPORT","url":"https://bugzilla.suse.com/1261214"},{"type":"REPORT","url":"https://bugzilla.suse.com/1261218"},{"type":"REPORT","url":"https://bugzilla.suse.com/1261219"},{"type":"REPORT","url":"https://bugzilla.suse.com/1261220"},{"type":"WEB","url":"https://www.suse.com/security/cve/CVE-2025-49010"},{"type":"WEB","url":"https://www.suse.com/security/cve/CVE-2025-66037"},{"type":"WEB","url":"https://www.suse.com/security/cve/CVE-2025-66038"},{"type":"WEB","url":"https://www.suse.com/security/cve/CVE-2025-66215"}],"schema_version":"1.7.5"}